Testing of Digital Systems

Testing of Digital Systems
Author : N. K. Jha
Publisher : Cambridge University Press
Total Pages :
Release : 2003-05-08
ISBN 10 : 1139437437
ISBN 13 : 9781139437431
Language : EN, FR, DE, ES & NL

Testing of Digital Systems Book Description:

Device testing represents the single largest manufacturing expense in the semiconductor industry, costing over $40 billion a year. The most comprehensive and wide ranging book of its kind, Testing of Digital Systems covers everything you need to know about this vitally important subject. Starting right from the basics, the authors take the reader through automatic test pattern generation, design for testability and built-in self-test of digital circuits before moving on to more advanced topics such as IDDQ testing, functional testing, delay fault testing, memory testing, and fault diagnosis. The book includes detailed treatment of the latest techniques including test generation for various fault models, discussion of testing techniques at different levels of integrated circuit hierarchy and a chapter on system-on-a-chip test synthesis. Written for students and engineers, it is both an excellent senior/graduate level textbook and a valuable reference.


RELATED BOOKS:
Testing of Digital Systems
Language: un
Pages:
Authors: N. K. Jha, S. Gupta
Categories: Computers
Type: BOOK - Published: 2003-05-08 - Publisher: Cambridge University Press

Device testing represents the single largest manufacturing expense in the semiconductor industry, costing over $40 billion a year. The most comprehensive and wide ranging book of its kind, Testing of Digital Systems covers everything you need to know about this vitally important subject. Starting right from the basics, the authors
Digital System Test and Testable Design
Language: un
Pages: 435
Authors: Zainalabedin Navabi
Categories: Technology & Engineering
Type: BOOK - Published: 2010-12-10 - Publisher: Springer Science & Business Media

This book is about digital system testing and testable design. The concepts of testing and testability are treated together with digital design practices and methodologies. The book uses Verilog models and testbenches for implementing and explaining fault simulation and test generation algorithms. Extensive use of Verilog and Verilog PLI for
Digital Systems Testing and Testable Design
Language: un
Pages: 672
Authors: Miron Abramovici, Melvin A. Breuer, Arthur D. Friedman
Categories: Technology & Engineering
Type: BOOK - Published: 1994-09-27 - Publisher: Wiley-IEEE Press

This updated printing of the leading text and reference in digital systems testing and testable design provides comprehensive, state-of-the-art coverage of the field. Included are extensive discussions of test generation, fault modeling for classic and new technologies, simulation, fault simulation, design for testability, built-in self-test, and diagnosis. Complete with numerous
Digital Systems Testing & Testable Design
Language: un
Pages: 670
Authors: Miron Abramovici, Melvin A. Breuer & Arthur D. Friedman
Categories: Technology & Engineering
Type: BOOK - Published: 2001-01-01 - Publisher:

This Textbook Provides A Comprehensive And Detailed Treatment Of Digital Systems Testing And Testable Design. It Covers Thoroughly Both The Fundamental Concepts And The Latest Advances In This Rapidly Changing Field, And Presents Only Theoretical Material That Supports Practical Applications. Successfully Used Worldwide, This Book Is An Invaluable Tool For
Digital Systems Testing and Testable Design
Language: un
Pages: 652
Authors: Miron Abramovici
Categories: Digital integrated circuits
Type: BOOK - Published: 2001-01-01 - Publisher:

This textbook provides a comprehensive and detailed treatment of digital systems testing and testable design. It covers thoroughly both the fundamental concepts and the latest advances in this rapidly changing field, and presents only theoretical material that supports practical applications. Successfully used worldwide, this book is an invaluable tool for